Date
Place
- Room H (Room Hall 1, 1F)
- P2. Poster Session II
- August 21, 2015 (Friday)
- 14:00 ~ 15:30
- [P2-55]
- 14:00 ~ 15:30
- Title:High Performance Moisture Barrier Comprised of Self-Aligned Organic-Inorganic Hybrid Layer and ALD Al2O3 for Thin-Film Encapsulation of OLEDs
- Dong-Won Choi (Hanyang Univ., Korea), Eun Ho Song (Korea Univ., Korea), Youngsoo Lee (Hanyang Univ., Korea), Byeong Kwon Ju (Korea Univ., Korea), and Jin-Seong Park (Hanyang Univ., Korea)
Abstract: Flexible Organic Light Emitting Diodes (OLEDs) have been recently considered to be the most promising device for next-generation displays. One of main issues for flexible OLEDs is reliable and/or robust Thin Film Encapsulation (TFE) technique such as materials, processes, and structures. Over the past few years, many researchers have studied TFE using Atomic Layer Deposition (ALD) Al2O3 due to its superior barrier properties. However, although the ALD Al2O3 film has an excellent barrier property, a single layer Al2O3 is not enough for the basic requirements of water vapor transmittance rate (WVTR) and mechanical flexibility. In order to improve gas barrier properties and flexibility, several previous studies of organic/inroganic hybrid structure for TFE have been investigated with various techniques (ALD, CVD, Sol-Gel, and PVD) since Vitex organic/inorganic structure was announced in 2003. Even though organic/inorganic structure is effective for improving gas barrier properties and flexibility, it has never achieved for ultimate requirements (Bending radius < 1mm and WVTR <10-6g/m2day). In this study, we investigated a multi-barrier for encapsulation of OLEDs using self-aligned organic-inorganic hybrid layer by solution process and Al2O3 by ALD, which would suggest a possible approach to achieve highly flexible and high diffusion barrier property. As a result, the suggested hybird layer exhibited better WVTR of 1.08 ¢¥ 10-4 g/m2day at 85oC/85%R.H than that (2.69 x 10-4 g/m2day)of single Al2O3. This presentation will be discussed with each film property, using Ca-test, contact angle measurement, AFM, SEM, and TEM
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